Power semiconductor device

Results: 192



#Item
101Carbides / Semiconductor device fabrication / Power electronics / Ceramic materials / Silicon carbide / Gallium nitride / Power semiconductor device / Wide bandgap semiconductors / Semiconductor device / Chemistry / Matter / Semiconductor devices

Trim Size: 170mm x 244mm Kimoto c01.tex V2[removed]:53 A.M. 1 Progress in Electronics

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Source URL: media.wiley.com

Language: English - Date: 2014-10-08 07:18:10
102Electronic engineering / Chemistry / Cascode / MOSFET / Transistor / Power semiconductor device / Field-effect transistor / Silicon carbide / JFET / Technology / Semiconductor devices / Power electronics

Investigation of SiC Stack and Discrete Cascodes Xueqing Li, Anup Bhalla, Petre Alexandrov, John Hostetler, and Leonid Fursin United Silicon Carbide, Inc., 7 Deer Park Drive, Suite E Monmouth Junction, New Jersey, USA

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Source URL: www.unitedsic.com

Language: English - Date: 2014-07-01 11:25:21
103Microtechnology / Power cables / Electronic design / Quad-flat no-leads package / Electrical wiring / Wire bonding / Integrated circuit packaging / Wire / Reliability / Semiconductor device fabrication / Technology / Electromagnetism

T&M, Wireless, Electronic Displays, ICs the news and products journal for the electronics industry www.canadianelectronics.ca ntitled-4 1

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Source URL: www.canadianelectronics.ca

Language: English - Date: 2012-05-08 09:16:36
104Electronics / Electromagnetism / Insulated gate bipolar transistor / Operations research / Electronic design automation / Simulation / Transistor / Power semiconductor device / Scientific modelling / Power electronics / Electronic engineering / Semiconductor devices

PDF Document

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Source URL: www.nist.gov

Language: English - Date: 2010-12-21 11:00:47
105Electronic engineering / Gallium nitride / Thyristor / Power semiconductor device / AC/AC converter / Electromagnetism / Electronics / Power electronics

Cool Systems with SiC and GaN 1 Euphoria and benefits to you “A new era begins,” “lowest losses,”

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Source URL: www.elektromobilitaet.fraunhofer.de

Language: English - Date: 2014-12-06 03:45:59
106Gallium nitride / IMEC / Ohmic contact / Aluminium gallium nitride / Light-emitting diode / Gan Chinese / BCL3 / Sulfur hexafluoride / Chemistry / Nitrides / Semiconductor device fabrication

DEVELOPMENT OF (Al)GaN RECESS ETCH FOR EMODE POWER HEMTs G. MANNAERT, V. PARASCHIV, B. DE JAEGER, M. VAN HOVE, M. DEMAND, S. DECOUTERE, W. BOULLART IMEC, KAPELDREEF 75, LEUVEN, B-3000, BELGIUM © IMEC[removed]CONFIDENTIA

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Source URL: www-leti.cea.fr

Language: English - Date: 2012-05-24 09:13:54
107Gallium nitride / IMEC / Ohmic contact / Aluminium gallium nitride / Light-emitting diode / Gan Chinese / BCL3 / Sulfur hexafluoride / Chemistry / Nitrides / Semiconductor device fabrication

DEVELOPMENT OF (Al)GaN RECESS ETCH FOR EMODE POWER HEMTs G. MANNAERT, V. PARASCHIV, B. DE JAEGER, M. VAN HOVE, M. DEMAND, S. DECOUTERE, W. BOULLART IMEC, KAPELDREEF 75, LEUVEN, B-3000, BELGIUM © IMEC[removed]CONFIDENTIA

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Source URL: www-leti.cea.fr

Language: English - Date: 2012-05-24 09:13:54
108Semiconductor devices / Power electronics / Power semiconductor device / Insulated gate bipolar transistor / Diode / Transistor / Gallium nitride / Failure rate / Thyristor / Electrical engineering / Electromagnetism / Electronics

International Foundation HFSJG Activity Report 2002 Name of research institute or organization: ABB Switzerland Ltd, Semiconductors

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Source URL: www.ifjungo.ch

Language: English - Date: 2014-03-27 09:52:19
109Electronics / Power electronics / Power semiconductor device / Diode / Insulated gate bipolar transistor / Transistor / Gallium nitride / Thyristor / Leakage / Semiconductor devices / Electrical engineering / Electromagnetism

Microsoft Word - 132_ABB_f.doc

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Source URL: www.ifjungo.ch

Language: English - Date: 2014-03-27 09:52:13
110Radiation / Neutron facilities / Baryons / Neutron / Cosmic ray / Power semiconductor device / Diode / Insulated gate bipolar transistor / Paul Scherrer Institute / Physics / Power electronics / Nuclear technology

The failure rates due due cosmic rays of biased high power semiconductors devices should be smaller than one failure per 109 hours and per cm2 silicon area (=1 FIT/cm2)

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Source URL: www.ifjungo.ch

Language: English - Date: 2014-03-27 09:52:37
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